Ir film structural properties for TES application

Iridium films grown by pulsed laser deposition (PLD) show different critical temperatures (Tc), which can be almost twice the Tc of the bulk. This difference is related to the thickness and deposition conditions. To understand this effect, we grew different films with different configuration parameters: laser focusing, distance to the Ir target, and deposition time. We then measured the Tc and analyzed the film with structural measurements by X-ray diffraction (XRD), looking at a possible correlation with the grain size of the film itself. The work was performed to determine the film growth conditions at which it is possible to obtain predetermination of Tc with good accuracy using XRD pattern characteristics of Ir films