The applications of machine learning (ML) in power electronics are expanding with time, providing effective tools that reduce design complexity and enhance predictive accuracy. In high-power semiconductor devices, such as thyristors and high-power diodes, electrical parameters may directly influence electro-thermal behavior, reliability, and overall device performance. Consequently, accurate prediction and classification of average current are critical to ensure optimal device selection, optimize design, and assess performance. In this article, a comprehensive dataset based on data from industrial thyristors capturing electrical and structural parameters relevant to current handling capability is utilized to classify and predict the average current of devices. Additionally, Shapley additive explanation (SHAP) analysis has been performed, highlighting the importance of crucial parameters and identifying the impact of each parameter on model output. Moreover, several ML models, including artificial neural networks (ANNs), support vector machines (SVMs), ensembles, and Gaussian process regression (GPR) are implemented and then compared to assess their performance. The proposed methodology provides manufacturers and designers with data-driven design tools that enhance reliability assessments and facilitate optimized device selection for high-power applications. Keywords: average current prediction; classification in semiconductor devices; electrical characterization; machine learning in semiconductors

Classification and Prediction of Average Current in High-Power Semiconductor Devices: A Machine Learning Framework

Fawad Ahmad;Luis Vaccaro;Mario Marchesoni;
2026-01-01

Abstract

The applications of machine learning (ML) in power electronics are expanding with time, providing effective tools that reduce design complexity and enhance predictive accuracy. In high-power semiconductor devices, such as thyristors and high-power diodes, electrical parameters may directly influence electro-thermal behavior, reliability, and overall device performance. Consequently, accurate prediction and classification of average current are critical to ensure optimal device selection, optimize design, and assess performance. In this article, a comprehensive dataset based on data from industrial thyristors capturing electrical and structural parameters relevant to current handling capability is utilized to classify and predict the average current of devices. Additionally, Shapley additive explanation (SHAP) analysis has been performed, highlighting the importance of crucial parameters and identifying the impact of each parameter on model output. Moreover, several ML models, including artificial neural networks (ANNs), support vector machines (SVMs), ensembles, and Gaussian process regression (GPR) are implemented and then compared to assess their performance. The proposed methodology provides manufacturers and designers with data-driven design tools that enhance reliability assessments and facilitate optimized device selection for high-power applications. Keywords: average current prediction; classification in semiconductor devices; electrical characterization; machine learning in semiconductors
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11567/1293276
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